Abstract—This paper presents methods that utilize multi-core PC to perform large-scale MOSFET circuit and transient sensitivity simulations in parallel. A very coarse-grained parallel computing scheme, called Combining Simulation Method (CSM), is proposed for both circuit and transient sensitivity simulations. Relaxation-based algorithms have been utilized as simulation algorithms in CSM, in which only minor modifications for algorithm codes are needed. All proposed methods have been implemented and tested in multi-core PCs. Experimental results justify good speedups and accurate results can be obtained.

Index Terms—circuit simulation, parallel computing,relaxation-based, sensitivity computation

Chun-Jung Chen is with the Dept. of Computer Science, Chinese Culture University, Taipei, Taiwan (e-mail: teacherchen62@yahoo.com.tw).

Cite: Chun-Jung Chen, "Parallel Circuit and Transient Sensitivity Simulations by Using Combining Simulation Method," International Journal of Computer and Communication Engineering vol. 1, no. 4, pp. 449-453 , 2012.