Volume 1 Number 3 (Sep. 2012)
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IJCCE 2012 Vol.1(3): 203-206 ISSN: 2010-3743
DOI: 10.7763/IJCCE.2012.V1.53

Harmonic Analysis of Exponential Nonlinear Devices and Validity of THD in Judging Nonlinearities

Nay Oo, Francois X. Nsabimana, Thomas Rohdenburg, and Woon-Seng Gan

Abstract—Derivations of generalized closed-form harmonic equations for a family of polynomial-approximated and parameterized exponential nonlinear devices (NLDs) are presented. The application of this research is for nonlinear signal processing based psychoacoustic bass enhancement systems. The derived harmonic equations are used to compute THD scores analytically to show that even though the nonlinear curves are different, which may cause different perceptual effects, the THD scores turn out to be exactly the same for all six exponential NLDs. The insights gained from this mathematical analysis indicate that, even without linking to perceptual attributes such as audio quality or nonlinear distortion perception, THD is not a suitable metric to judge or measure the quantitative degrees of nonlinear curves.

Index Terms—Total harmonic distortion, nonlinear systems, nonlinear devices

Nay Oo, Francois X. Nsabimana, and Thomas Rohdenburg are with the Department of Hearing, Speech and Audio Technology (HSA), Fraunhofer Institute for Digital Media Technology (IDMT), Oldenburg, Germany (email:nay.oo@idmt.fraunhofer.de)
Woon-Seng Gan is with School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore.

Cite: Nay Oo, Francois X. Nsabimana, Thomas Rohdenburg, and Woon-Seng Gan, "Harmonic Analysis of Exponential Nonlinear Devices and Validity of THD in Judging Nonlinearities," International Journal of Computer and Communication Engineering vol. 1, no. 3, pp. 203-206 , 2012.

General Information

ISSN: 2010-3743 (Online)
Abbreviated Title: Int. J. Comput. Commun. Eng.
Frequency: Quarterly
Editor-in-Chief: Dr. Maode Ma
Abstracting/ Indexing: INSPEC, CNKI, Google Scholar, Crossref, EBSCO, ProQuest, and Electronic Journals Library
E-mail: ijcce@iap.org
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